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Introduction

   New Atomic Resolution Electron Microscopy for Materials Science

Electron Microscopy and Material Science Laboratory is aiming for opening up a new era in materials science and engineering by fusing advanced electron microscopy development and materials science research at a high level. Specifically, we are strongly promoting the development of new atomic resolution electron microscopy and the research of materials that are extremely important for society and industry such as metals, ceramics, devices, magnetic and organic materials, as two wheels of a cart. By developing a new electron microscopy that does not exist anywhere, we will create a new "eye" for materials, and use that "eye" to explore a sub-atomic scale world of materials. Such exciting research we are aiming!

April, 2020

Naoya Shibata

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JST ERATO "Ultra-Atomic Resolution Electron Microscopy Project"

In the ERATO project of the Japan Science and Technology Agency (JST), where Professor Naoya Shibata serves as research supervisor, we are developing a new type of electron microscope, developing a new electron microscopy method, and applying it to materials research. Please visit Project Website for details.

ホーム: ニュース

Topics

6/30/2026

Notice

Prof. Maria Varela at Universidad Complutense de Madrid delivered a lecture for 33rd Next Generation Electron Microscopy. Detail

6/11/2026

Award

Dr. Shinsuke Hashimoto, our former colleagure, has received the Award of the Outstanding Papers Published in the JCS-Japan in 2025. Detail

5/31/2026

Notice

Takehito Seki has been promoted to Associate Professor.

5/27/2026

Award

Yu Nishiuchi, a first-year Master's student, won Poster Award at the 82nd Annual Meeting of The Japanese Society of Microscopy.

5/27/2026

Award

Ayumu Oyaizu, a second-year Master's student, won Oral Presentation Award at the 82nd Annual Meeting of The Japanese Society of Microscopy.

5/21/2026

Notice

Prof. Ondrej Krivanek at Bruker and Prof. Philipp Haslinger at Vienna University of Technology delivered lectures for 31/32th Next Generation Electron Microscopy. Detail

ホーム: 研究

Magnetic-Field-Free Electron Microscope

Quantitative Electromagnetic Field Imaging

Ultra-high Sensitive STEM Imaging

Atomic structure of Silicon Steel Grain boundaries

Local Electromagnetic Field in Device Materials

Charge Density Analysis at Crystal Interfaces

…and more

Members

Members

Professor

shibata [at] sigma.t.u-tokyo.ac.jp

Project Associate Professor

ishikawa [at] sigma.t.u-tokyo.ac.jp

Project Associate Professor

feng [at] sigma.t.u-tokyo.ac.jp

Associate Professor

seki [at] sigma.t.u-tokyo.ac.jp

Assistant Professor

toyama [at] sigma.t.u-tokyo.ac.jp

Assistant Professor

sasano [at] sigma.t.u-tokyo.ac.jp

Project Researcher

futazuka [at] sigma.t.u-tokyo.ac.jp

Secretary

Emiko Hatano

hatano [at] sigma.t.u-tokyo.ac.jp

Senior Researcher

takao.matsumoto [at] sogo.t.u-tokyo.ac.jp

Technical Assistant

iwata [at] sigma.t.u-tokyo.ac.jp

Project Researcher

JSPS Postdoctoral Fellowship

yoo [at] sigma.t.u-tokyo.ac.jp

Project Researcher

JSPS Postdoctoral Fellowship

aowenli [at] sigma.t.u-tokyo.ac.jp

Project Researcher

yzzheng [at] sigma.t.u-tokyo.ac.jp

Exchange student

POSTECH

minsukim [at] sigma.t.u-tokyo.ac.jp

Exchange student

Indian Institute of Science

Surafel Shiferaw Legese

surafel [at] sigma.t.u-tokyo.ac.jp

Technical Assistant

Natsumi Saito

saito.natsumi [at] sigma.t.u-tokyo.ac.jp

Technical Assistant

Tomomi Miura

miura [at] sogo.t.u-tokyo.ac.jp

JSPS Postdoctoral Fellowship

JSPS Fellow(DC2), MERIT

tabata [at] sigma.t.u-tokyo.ac.jp

D2

FUJIFILM Co.

yamashita[at]sigma.t.u-tokyo.ac.jp

D1

MERIT

xu [at] sigma.t.u-tokyo.ac.jp

D1

yamamoto [at] sigma.t.u-tokyo.ac.jp

M2

asano [at] sigma.t.u-tokyo.ac.jp

M2

oyaizu [at] sigma.t.u-tokyo.ac.jp

M2

oe.konosuke [at] sigma.t.u-tokyo.ac.jp

M1

ichiryu [at] sigma.t.u-tokyo.ac.jp

M1

imai [at] sigma.t.u-tokyo.ac.jp

M1

nishiuchi [at] sigma.t.u-tokyo.ac.jp

B4

kotake [at] sigma.t.u-tokyo.ac.jp

B4

Sota Matsushita

matsushita [at] sigma.t.u-tokyo.ac.jp

B4

Kentaro Miura

miura [at] sigma.t.u-tokyo.ac.jp

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April 2026
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September 2025
ホーム: お問い合わせ

Access

Yayoi 2-11-16, Bunkyo-ku, Tokyo 113-0032, Japan

Room 315, Faculty of Engineering Bldg. 9, 

​TEL: 03-5841-0415

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©2020 by 電子顕微鏡材料学研究室

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